Jose M. Gata-Romero, Andrés Santana-Andreo, Elisenda Roca, Rafael Castro-López, Francisco V. Fernández 0001. A Test Module for Aging Characterization of Digital Circuits. In 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2023, Funchal, Portugal, July 3-5, 2023. pages 1-4, IEEE, 2023. [doi]
Abstract is missing.