John Gatej, Lee Song, Carol Pyron, Rajesh Raina, Tom Munns. valuating ATE Features in Terms of Test Escape Rates and Other Cost of Test Culprits. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 1040-1049, IEEE Computer Society, 2002. [doi]
Abstract is missing.