Anne Gattiker, Manjul Bhushan, Mark B. Ketchen. Data Analysis Techniques for CMOS Technology Characterization and Product Impact Assessment. In Scott Davidson, Anne Gattiker, editors, 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. pages 1-10, IEEE, 2006. [doi]
Abstract is missing.