Integrating Self Testability with Design Space Exploration by a Controller based Estimation Technique

M. S. Gaur, Mark Zwolinski. Integrating Self Testability with Design Space Exploration by a Controller based Estimation Technique. In 17th International Conference on VLSI Design (VLSI Design 2004), with the 3rd International Conference on Embedded Systems Design, 5-9 January 2004, Mumbai, India. pages 901-906, IEEE Computer Society, 2004. [doi]

Abstract

Abstract is missing.