G. Gautier, S. Crand, Olivier Bonnaud. Dynamic electrical characterization of CMOS-like Thin Film Transistor circuits. In 2003 International Conference on Microelectronics Systems Education (MSE 2003), Educating Tomorrow s Microsystems Designers, 1-2 June 2003, Anaheim, CA, USA. pages 14-15, IEEE Computer Society, 2003. [doi]
Abstract is missing.