Eman Kamel Gawish, M. Watheq El-Kharashi, M. F. Abu-Elyazeed. Process variability-induced NoC link failure: A probabilistic model. Microelectronics Journal, 46(3):248-257, 2015. [doi]
@article{GawishEA15,
title = {Process variability-induced NoC link failure: A probabilistic model},
author = {Eman Kamel Gawish and M. Watheq El-Kharashi and M. F. Abu-Elyazeed},
year = {2015},
doi = {10.1016/j.mejo.2015.01.004},
url = {http://dx.doi.org/10.1016/j.mejo.2015.01.004},
researchr = {https://researchr.org/publication/GawishEA15},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {46},
number = {3},
pages = {248-257},
}