Process variability-induced NoC link failure: A probabilistic model

Eman Kamel Gawish, M. Watheq El-Kharashi, M. F. Abu-Elyazeed. Process variability-induced NoC link failure: A probabilistic model. Microelectronics Journal, 46(3):248-257, 2015. [doi]

References

No references recorded for this publication.

Cited by

No citations of this publication recorded.