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A cross-layer analysis of Soft Error, aging and process variation in Near Threshold Computing

Anteneh Gebregiorgis, Saman Kiamehr, Fabian Oboril, Rajendra Bishnoi, Mehdi Baradaran Tahoori. A cross-layer analysis of Soft Error, aging and process variation in Near Threshold Computing. In Luca Fanucci, Jürgen Teich, editors, 2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016. pages 205-210, IEEE, 2016. [doi]

Authors

Anteneh Gebregiorgis

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Saman Kiamehr

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Fabian Oboril

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Rajendra Bishnoi

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Mehdi Baradaran Tahoori

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