Anteneh Gebregiorgis, Saman Kiamehr, Fabian Oboril, Rajendra Bishnoi, Mehdi Baradaran Tahoori. A cross-layer analysis of Soft Error, aging and process variation in Near Threshold Computing. In Luca Fanucci, Jürgen Teich, editors, 2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016. pages 205-210, IEEE, 2016. [doi]
@inproceedings{GebregiorgisKOB16,
title = {A cross-layer analysis of Soft Error, aging and process variation in Near Threshold Computing},
author = {Anteneh Gebregiorgis and Saman Kiamehr and Fabian Oboril and Rajendra Bishnoi and Mehdi Baradaran Tahoori},
year = {2016},
url = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=7459305},
researchr = {https://researchr.org/publication/GebregiorgisKOB16},
cites = {0},
citedby = {0},
pages = {205-210},
booktitle = {2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016},
editor = {Luca Fanucci and Jürgen Teich},
publisher = {IEEE},
isbn = {978-3-9815-3707-9},
}