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Test Pattern Generation for Approximate Circuits Based on Boolean Satisfiability

Anteneh Gebregiorgis, Mehdi Baradaran Tahoori. Test Pattern Generation for Approximate Circuits Based on Boolean Satisfiability. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2019, Florence, Italy, March 25-29, 2019. pages 1028-1033, IEEE, 2019. [doi]

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Anteneh Gebregiorgis

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Mehdi Baradaran Tahoori

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