Anteneh Gebregiorgis, Mehdi Baradaran Tahoori. Test Pattern Generation for Approximate Circuits Based on Boolean Satisfiability. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2019, Florence, Italy, March 25-29, 2019. pages 1028-1033, IEEE, 2019. [doi]
@inproceedings{GebregiorgisT19,
title = {Test Pattern Generation for Approximate Circuits Based on Boolean Satisfiability},
author = {Anteneh Gebregiorgis and Mehdi Baradaran Tahoori},
year = {2019},
doi = {10.23919/DATE.2019.8714898},
url = {https://doi.org/10.23919/DATE.2019.8714898},
researchr = {https://researchr.org/publication/GebregiorgisT19},
cites = {0},
citedby = {0},
pages = {1028-1033},
booktitle = {Design, Automation & Test in Europe Conference & Exhibition, DATE 2019, Florence, Italy, March 25-29, 2019},
publisher = {IEEE},
isbn = {978-3-9819263-2-3},
}