Anteneh Gebregiorgis, Lizhou Wu, Christopher Münch, Siddharth Rao, Mehdi B. Tahoori, Said Hamdioui. Special Session: STT-MRAMs: Technology, Design and Test. In 40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022. pages 1-10, IEEE, 2022. [doi]
@inproceedings{GebregiorgisWMR22,
title = {Special Session: STT-MRAMs: Technology, Design and Test},
author = {Anteneh Gebregiorgis and Lizhou Wu and Christopher Münch and Siddharth Rao and Mehdi B. Tahoori and Said Hamdioui},
year = {2022},
doi = {10.1109/VTS52500.2021.9794278},
url = {https://doi.org/10.1109/VTS52500.2021.9794278},
researchr = {https://researchr.org/publication/GebregiorgisWMR22},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022},
publisher = {IEEE},
isbn = {978-1-6654-1060-1},
}