Anteneh Gebregiorgis, Lizhou Wu, Christopher Münch, Siddharth Rao, Mehdi B. Tahoori, Said Hamdioui. Special Session: STT-MRAMs: Technology, Design and Test. In 40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022. pages 1-10, IEEE, 2022. [doi]
Abstract is missing.