Sébastien Gebus, Kauko Leiviskä. Defect-related knowledge acquisition for decision support systems in electronics assembly. In Janan Zaytoon, Jean-Louis Ferrier, Juan Andrade-Cetto, Joaquim Filipe, editors, ICINCO 2007, Proceedings of the Fourth International Conference on Informatics in Control, Automation and Robotics, Intelligent Control Systems and Optimization, Angers, France, May 9-12, 2007. pages 270-275, INSTICC Press, 2007.
@inproceedings{GebusL07,
title = {Defect-related knowledge acquisition for decision support systems in electronics assembly},
author = {Sébastien Gebus and Kauko Leiviskä},
year = {2007},
researchr = {https://researchr.org/publication/GebusL07},
cites = {0},
citedby = {0},
pages = {270-275},
booktitle = {ICINCO 2007, Proceedings of the Fourth International Conference on Informatics in Control, Automation and Robotics, Intelligent Control Systems and Optimization, Angers, France, May 9-12, 2007},
editor = {Janan Zaytoon and Jean-Louis Ferrier and Juan Andrade-Cetto and Joaquim Filipe},
publisher = {INSTICC Press},
isbn = {978-972-8865-82-5},
}