Peter Geens, Wim Dehaene. A dual port dual width 90nm SRAM with guaranteed data retention at minimal standby supply voltage. In William Redman-White, Anthony J. Walton, editors, ESSCIRC 2008 - 34th European Solid-State Circuits Conference, Edinburgh, Scotland, UK, 15-19 September 2008. pages 290-293, IEEE, 2008. [doi]
Abstract is missing.