Cost-aware test pattern ordering for VLSI using an enhanced LSTNet architecture

Bintao Geng, Ying Sun, Tai Song, Yadong Li. Cost-aware test pattern ordering for VLSI using an enhanced LSTNet architecture. Integration, 109:102741, 2026. [doi]

Authors

Bintao Geng

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Ying Sun

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Tai Song

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Yadong Li

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