Bintao Geng, Ying Sun, Tai Song, Yadong Li. Cost-aware test pattern ordering for VLSI using an enhanced LSTNet architecture. Integration, 109:102741, 2026. [doi]
@article{GengSSL26,
title = {Cost-aware test pattern ordering for VLSI using an enhanced LSTNet architecture},
author = {Bintao Geng and Ying Sun and Tai Song and Yadong Li},
year = {2026},
doi = {10.1016/j.vlsi.2026.102741},
url = {https://doi.org/10.1016/j.vlsi.2026.102741},
researchr = {https://researchr.org/publication/GengSSL26},
cites = {0},
citedby = {0},
journal = {Integration},
volume = {109},
pages = {102741},
}