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Hotspot Detection via Attention-Based Deep Layout Metric Learning

Hao Geng, Haoyu Yang, Lu Zhang, Fan Yang 0001, Xuan Zeng 0001, Bei Yu 0001. Hotspot Detection via Attention-Based Deep Layout Metric Learning. IEEE Trans. on CAD of Integrated Circuits and Systems, 41(8):2685-2698, 2022. [doi]

Authors

Hao Geng

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Haoyu Yang

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Lu Zhang

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Fan Yang 0001

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Xuan Zeng 0001

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Bei Yu 0001

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