Hao Geng, Haoyu Yang, Lu Zhang, Fan Yang 0001, Xuan Zeng 0001, Bei Yu 0001. Hotspot Detection via Attention-Based Deep Layout Metric Learning. IEEE Trans. on CAD of Integrated Circuits and Systems, 41(8):2685-2698, 2022. [doi]
@article{GengYZYZY22,
title = {Hotspot Detection via Attention-Based Deep Layout Metric Learning},
author = {Hao Geng and Haoyu Yang and Lu Zhang and Fan Yang 0001 and Xuan Zeng 0001 and Bei Yu 0001},
year = {2022},
doi = {10.1109/TCAD.2021.3112637},
url = {https://doi.org/10.1109/TCAD.2021.3112637},
researchr = {https://researchr.org/publication/GengYZYZY22},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {41},
number = {8},
pages = {2685-2698},
}