Abstraction-based relation mining for functional test generation

Kelson Gent, Michael S. Hsiao. Abstraction-based relation mining for functional test generation. In 33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015. pages 1-6, IEEE, 2015. [doi]

Authors

Kelson Gent

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Michael S. Hsiao

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