Kelson Gent, Michael S. Hsiao. Abstraction-based relation mining for functional test generation. In 33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015. pages 1-6, IEEE, 2015. [doi]
@inproceedings{GentH15,
title = {Abstraction-based relation mining for functional test generation},
author = {Kelson Gent and Michael S. Hsiao},
year = {2015},
doi = {10.1109/VTS.2015.7116286},
url = {http://dx.doi.org/10.1109/VTS.2015.7116286},
researchr = {https://researchr.org/publication/GentH15},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015},
publisher = {IEEE},
isbn = {978-1-4799-7597-6},
}