Fault modeling and testing of through silicon via interconnections - researchr publication authors

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Vasileios Gerakis, Leonidas Katselas, Alkis A. Hatzopoulos. Fault modeling and testing of through silicon via interconnections. In 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015. pages 30-31, IEEE, 2015. [doi]

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