Vasileios Gerakis, Leonidas Katselas, Alkis A. Hatzopoulos. Fault modeling and testing of through silicon via interconnections. In 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015. pages 30-31, IEEE, 2015. [doi]
@inproceedings{GerakisKH15,
title = {Fault modeling and testing of through silicon via interconnections},
author = {Vasileios Gerakis and Leonidas Katselas and Alkis A. Hatzopoulos},
year = {2015},
doi = {10.1109/IOLTS.2015.7229824},
url = {http://dx.doi.org/10.1109/IOLTS.2015.7229824},
researchr = {https://researchr.org/publication/GerakisKH15},
cites = {0},
citedby = {0},
pages = {30-31},
booktitle = {21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015},
publisher = {IEEE},
isbn = {978-1-4673-7905-2},
}