Nicolas Gerlin, Endri Kaja, Fabian Vargas, Li Lu, Anselm Breitenreiter, Junchao Chen 0001, Markus Ulbricht 0002, Maribel Gomez, Ares Tahiraga, Sebastian Prebeck, Eyck Jentzsch, Milos Krstic, Wolfgang Ecker. Bits, Flips and RISCs. In Maksim Jenihhin, Hana Kubátová, Nele Metens, Jaan Raik, Foisal Ahmed, Jan Belohoubek, editors, 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2023, Tallinn, Estonia, May 3-5, 2023. pages 140-149, IEEE, 2023. [doi]
Abstract is missing.