Samuele Germiniani, Moreno Bragaglio, Graziano Pravadelli. MIST: monitor generation from informal specifications for firmware verification. In 28th IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SOC 2020, Salt Lake City, UT, USA, October 5-7, 2020. pages 111-116, IEEE, 2020. [doi]
@inproceedings{GerminianiBP20,
title = {MIST: monitor generation from informal specifications for firmware verification},
author = {Samuele Germiniani and Moreno Bragaglio and Graziano Pravadelli},
year = {2020},
doi = {10.1109/VLSI-SOC46417.2020.9344072},
url = {https://doi.org/10.1109/VLSI-SOC46417.2020.9344072},
researchr = {https://researchr.org/publication/GerminianiBP20},
cites = {0},
citedby = {0},
pages = {111-116},
booktitle = {28th IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SOC 2020, Salt Lake City, UT, USA, October 5-7, 2020},
publisher = {IEEE},
isbn = {978-1-7281-5409-1},
}