Samuele Germiniani, Moreno Bragaglio, Graziano Pravadelli. MIST: monitor generation from informal specifications for firmware verification. In 28th IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SOC 2020, Salt Lake City, UT, USA, October 5-7, 2020. pages 111-116, IEEE, 2020. [doi]
Abstract is missing.