Test point insertion for compact test sets

M. J. Geuzebroek, J. Th. van der Linden, A. J. van de Goor. Test point insertion for compact test sets. In Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000. pages 292-301, IEEE Computer Society, 2000.

Authors

M. J. Geuzebroek

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J. Th. van der Linden

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A. J. van de Goor

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