M. J. Geuzebroek, J. Th. van der Linden, A. J. van de Goor. Test point insertion for compact test sets. In Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000. pages 292-301, IEEE Computer Society, 2000.
@inproceedings{GeuzebroekLG00,
title = {Test point insertion for compact test sets},
author = {M. J. Geuzebroek and J. Th. van der Linden and A. J. van de Goor},
year = {2000},
tags = {testing},
researchr = {https://researchr.org/publication/GeuzebroekLG00},
cites = {0},
citedby = {0},
pages = {292-301},
booktitle = {Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000},
publisher = {IEEE Computer Society},
}