Impact of interface and bulk trapped charges on transistor reliability

G. Ghidini, M. Langenbuch, R. Bottini, D. Brazzelli, A. Ghetti, N. Galbiati, G. Giusto, A. Garavaglia. Impact of interface and bulk trapped charges on transistor reliability. Microelectronics Reliability, 45(5-6):857-860, 2005. [doi]

Abstract

Abstract is missing.