D. Brazzelli - researchr alias

researchr

You are not signed in
Sign in
Sign up

Viewing Publication 1 - 4 from 4

2005

Impact of interface and bulk trapped charges on transistor reliabilityG. Ghidini, M. Langenbuch, R. Bottini, D. Brazzelli, A. Ghetti, N. Galbiati, G. Giusto, A. Garavaglia. mr, 45(5-6):857-860, 2005. [doi]

2003

Anomalous gate oxide conduction on isolation edges: analysis and process optimizationA. Ghetti, D. Brazzelli, A. Benvenuti, G. Ghidini, A. Pavan. mr, 43(8):1229-1235, 2003. [doi]

2002

Evaluation methodology of thin dielectrics for non-volatile memory applicationG. Ghidini, D. Brazzelli. mr, 42(9-11):1473-1480, 2002. [doi]

2001

Optimization of WSi::2:: by SiH::4:: CVD: impact on oxide qualityD. Brazzelli, G. Ghidini, C. Riva. mr, 41(7):1003-1006, 2001. [doi]

Sign in or sign up to see more results.

runs on WebDSL