Delay Fault Localization in Test-Per-Scan BIST Using Built-In Delay Sensor - researchr publication authors

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Swaroop Ghosh, Swarup Bhunia, Arijit Raychowdhury, Kaushik Roy. Delay Fault Localization in Test-Per-Scan BIST Using Built-In Delay Sensor. In 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 10-12 July 2006, Como, Italy. pages 31-36, IEEE Computer Society, 2006. [doi]

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