Swaroop Ghosh, Swarup Bhunia, Arijit Raychowdhury, Kaushik Roy. Delay Fault Localization in Test-Per-Scan BIST Using Built-In Delay Sensor. In 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 10-12 July 2006, Como, Italy. pages 31-36, IEEE Computer Society, 2006. [doi]
@inproceedings{GhoshBRR06,
title = {Delay Fault Localization in Test-Per-Scan BIST Using Built-In Delay Sensor},
author = {Swaroop Ghosh and Swarup Bhunia and Arijit Raychowdhury and Kaushik Roy},
year = {2006},
doi = {10.1109/IOLTS.2006.19},
url = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2006.19},
tags = {testing},
researchr = {https://researchr.org/publication/GhoshBRR06},
cites = {0},
citedby = {0},
pages = {31-36},
booktitle = {12th IEEE International On-Line Testing Symposium (IOLTS 2006), 10-12 July 2006, Como, Italy},
publisher = {IEEE Computer Society},
isbn = {0-7695-2620-9},
}