Shalini Ghosh, Sugato Basu, Nur A. Touba. Joint Minimization of Power and Area in Scan Testing by Scan Cell Reordering. In 2003 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2003), New Trends and Technologies for VLSI Systems Design, 20-21 February 2003, Tampa, FL, USA. pages 246-249, IEEE Computer Society, 2003. [doi]
Abstract is missing.