Shalini Ghosh, F. Joel Ferguson. Estimating detection probability of interconnect opens using stuck-at tests. In David Garrett, John Lach, Charles A. Zukowski, editors, Proceedings of the 14th ACM Great Lakes Symposium on VLSI 2004, Boston, MA, USA, April 26-28, 2004. pages 254-259, ACM, 2004. [doi]
Abstract is missing.