On-Chip Process Variation Detection and Compensation Using Delay and Slew-Rate Monitoring Circuits

Amlan Ghosh, Rahul M. Rao, Ching-Te Chuang, Richard B. Brown. On-Chip Process Variation Detection and Compensation Using Delay and Slew-Rate Monitoring Circuits. In 9th International Symposium on Quality of Electronic Design (ISQED 2008), 17-19 March 2008, San Jose, CA, USA. pages 815-820, IEEE Computer Society, 2008. [doi]

Abstract

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