Amlan Ghosh, Rahul M. Rao, Jae-Joon Kim, Ching-Te Chuang, Richard B. Brown. On-Chip Process Variation Detection Using Slew-Rate Monitoring Circuit. In 21st International Conference on VLSI Design (VLSI Design 2008), 4-8 January 2008, Hyderabad, India. pages 143-149, IEEE Computer Society, 2008. [doi]
Abstract is missing.