Georges G. E. Gielen, Elie Maricau. Stochastic degradation modeling and simulation for analog integrated circuits in nanometer CMOS. In Enrico Macii, editor, Design, Automation and Test in Europe, DATE 13, Grenoble, France, March 18-22, 2013. pages 326-331, EDA Consortium San Jose, CA, USA / ACM DL, 2013. [doi]
@inproceedings{GielenM13,
title = {Stochastic degradation modeling and simulation for analog integrated circuits in nanometer CMOS},
author = {Georges G. E. Gielen and Elie Maricau},
year = {2013},
url = {http://dl.acm.org/citation.cfm?id=2485368},
researchr = {https://researchr.org/publication/GielenM13},
cites = {0},
citedby = {0},
pages = {326-331},
booktitle = {Design, Automation and Test in Europe, DATE 13, Grenoble, France, March 18-22, 2013},
editor = {Enrico Macii},
publisher = {EDA Consortium San Jose, CA, USA / ACM DL},
isbn = {978-1-4503-2153-2},
}