Georges G. E. Gielen, Elie Maricau, Peter H. N. De Wit. Analog circuit reliability in sub-32 nanometer CMOS: Analysis and mitigation. In Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011. pages 1474-1479, IEEE, 2011. [doi]
@inproceedings{GielenMW11,
title = {Analog circuit reliability in sub-32 nanometer CMOS: Analysis and mitigation},
author = {Georges G. E. Gielen and Elie Maricau and Peter H. N. De Wit},
year = {2011},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5763239},
researchr = {https://researchr.org/publication/GielenMW11},
cites = {0},
citedby = {0},
pages = {1474-1479},
booktitle = {Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011},
publisher = {IEEE},
isbn = {978-1-61284-208-0},
}