The following publications are possibly variants of this publication:
- Computer-Aided Analog Circuit Design for Reliability in Nanometer CMOSElie Maricau, Georges G. E. Gielen. esticas, 1(1):50-58, 2011. [doi]
- Design tools and circuit solutions for degradation-resilient analog circuits in nanometer CMOSGeorges G. E. Gielen. ddecs 2009: 1 [doi]
- Emerging Yield and Reliability Challenges in Nanometer CMOS TechnologiesGeorges G. E. Gielen, P. De Wit, E. Maricau, J. Loeckx, J. Martin-Martinez, Ben Kaczer, Guido Groeseneken, R. Rodríguez, M. Nafría. date 2008: 1322-1327 [doi]