O. Ginez, Jean Michel Daga, Marylene Combe, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel. An Overview of Failure Mechanisms in Embedded Flash Memories. In 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA. pages 108-113, IEEE Computer Society, 2006. [doi]
Abstract is missing.