Olivier Ginez, Jean Michel Portal, Hassen Aziza. A High-Speed Structural Method for Testing Address Decoder Faults in Flash Memories. In Douglas Young, Nur A. Touba, editors, 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008. pages 1-10, IEEE, 2008. [doi]
Abstract is missing.