Olivier Ginez, Jean Michel Portal, Ch. Muller. Design and Test Challenges in Resistive Switching RAM (ReRAM): An Electrical Model for Defect Injections. In 14th IEEE European Test Symposium, ETS 2009, Sevilla, Spain, May 25-29, 2009. pages 61-66, IEEE Computer Society, 2009. [doi]
@inproceedings{GinezPM09,
title = {Design and Test Challenges in Resistive Switching RAM (ReRAM): An Electrical Model for Defect Injections},
author = {Olivier Ginez and Jean Michel Portal and Ch. Muller},
year = {2009},
doi = {10.1109/ETS.2009.23},
url = {http://doi.ieeecomputersociety.org/10.1109/ETS.2009.23},
tags = {testing, design},
researchr = {https://researchr.org/publication/GinezPM09},
cites = {0},
citedby = {0},
pages = {61-66},
booktitle = {14th IEEE European Test Symposium, ETS 2009, Sevilla, Spain, May 25-29, 2009},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3703-0},
}