Patrick Girard. Power-aware testing in the Era of IoT. In 19th International Symposium on Quality Electronic Design, ISQED 2018, Santa Clara, CA, USA, March 13-14, 2018. pages 17-20, IEEE, 2018. [doi]
@inproceedings{Girard18-0,
title = {Power-aware testing in the Era of IoT},
author = {Patrick Girard},
year = {2018},
doi = {10.1109/ISQED.2018.8357254},
url = {https://doi.org/10.1109/ISQED.2018.8357254},
researchr = {https://researchr.org/publication/Girard18-0},
cites = {0},
citedby = {0},
pages = {17-20},
booktitle = {19th International Symposium on Quality Electronic Design, ISQED 2018, Santa Clara, CA, USA, March 13-14, 2018},
publisher = {IEEE},
isbn = {978-1-5386-1214-9},
}