Patrick Girard 0001, Yuanqing Cheng, Arnaud Virazel, Wei Zhao 0010, Rajendra Bishnoi, Mehdi B. Tahoori. A Survey of Test and Reliability Solutions for Magnetic Random Access Memories. Proceedings of the IEEE, 109(2):149-169, 2021. [doi]
@article{GirardCVZBT21,
title = {A Survey of Test and Reliability Solutions for Magnetic Random Access Memories},
author = {Patrick Girard 0001 and Yuanqing Cheng and Arnaud Virazel and Wei Zhao 0010 and Rajendra Bishnoi and Mehdi B. Tahoori},
year = {2021},
doi = {10.1109/JPROC.2020.3029600},
url = {https://doi.org/10.1109/JPROC.2020.3029600},
researchr = {https://researchr.org/publication/GirardCVZBT21},
cites = {0},
citedby = {0},
journal = {Proceedings of the IEEE},
volume = {109},
number = {2},
pages = {149-169},
}