GC-eDRAM with Body-Bias Compensated Readout and Error Detection in 28nm FD-SOI

Robert Giterman, Andrea Bonetti, Andreas Burg, Adam Teman. GC-eDRAM with Body-Bias Compensated Readout and Error Detection in 28nm FD-SOI. In IEEE International Symposium on Circuits and Systems, ISCAS 2020, Sevilla, Spain, October 10-21, 2020. pages 1, IEEE, 2020. [doi]

Abstract

Abstract is missing.