External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Tags

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

Mixed Level Hierarchical Test Generation for Transition Faults and Overcurrent Related Defects

Uwe Gläser, Uwe Hübner, Heinrich Theodor Vierhaus. Mixed Level Hierarchical Test Generation for Transition Faults and Overcurrent Related Defects. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 21-29, IEEE Computer Society, 1992.

Abstract

Abstract is missing.

runs on