Testing and Diagnosis of Power Switches in SOCs

Sandeep Kumar Goel, Maurice Meijer, José Pineda de Gyvez. Testing and Diagnosis of Power Switches in SOCs. In 11th European Test Symposium (ETS 2006), 21-24 May 2006, Southhampton, UK. pages 145-150, IEEE Computer Society, 2006. [doi]

Authors

Sandeep Kumar Goel

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Maurice Meijer

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José Pineda de Gyvez

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