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Sandeep Kumar Goel, Maurice Meijer, José Pineda de Gyvez. Testing and Diagnosis of Power Switches in SOCs. In 11th European Test Symposium (ETS 2006), 21-24 May 2006, Southhampton, UK. pages 145-150, IEEE Computer Society, 2006. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Efficient testing and diagnosis of faulty power switches in SOCsSandeep Kumar Goel, Maurice Meijer, José Pineda de Gyvez. iet-cdt, 1(3):230-236, 2007. [doi]
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