Sandeep Kumar Goel, Maurice Meijer, José Pineda de Gyvez. Testing and Diagnosis of Power Switches in SOCs. In 11th European Test Symposium (ETS 2006), 21-24 May 2006, Southhampton, UK. pages 145-150, IEEE Computer Society, 2006. [doi]
@inproceedings{GoelMG06,
title = {Testing and Diagnosis of Power Switches in SOCs},
author = {Sandeep Kumar Goel and Maurice Meijer and José Pineda de Gyvez},
year = {2006},
doi = {10.1109/ETS.2006.47},
url = {http://doi.ieeecomputersociety.org/10.1109/ETS.2006.47},
tags = {testing},
researchr = {https://researchr.org/publication/GoelMG06},
cites = {0},
citedby = {0},
pages = {145-150},
booktitle = {11th European Test Symposium (ETS 2006), 21-24 May 2006, Southhampton, UK},
publisher = {IEEE Computer Society},
isbn = {0-7695-2566-0},
}