Sameer Goel, Rubin A. Parekhji. Choosing the Right Mix of At-speed Structural Test Patterns: Comparisons in Pattern Volume Reduction and Fault Detection Efficiency. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India. pages 330-336, IEEE Computer Society, 2005. [doi]
Abstract is missing.